http://www.nanoprobenetwork.org/forum/discussions/feed.rss Fri, 18 May 12 13:56:04 -0400 All Discussions - NanoProbe Network Forum en-CA http://www.nanoprobenetwork.org/forum/discussion/84/lateral-force-calibration-using-the-test-probe-method Thu, 29 Mar 2012 07:58:48 -0400 M. Tekaat 84@/forum/discussions ]]> http://www.nanoprobenetwork.org/forum/discussion/83/single-molecule-unfolding-experiments Wed, 14 Mar 2012 23:47:17 -0400 bigkahunaburger 83@/forum/discussions
I can see the sawtooth pattern, but I'm unsure why the force doesn't return to zero after each sawtooth ruptures. At the end of each sawtooth rupture there is still >80pN force exerted on the cantilever.

I was wondering whether anyone had an explanation for why the force doesn't return 0 after each sawtooth.

Any help would be appreciated.]]> http://www.nanoprobenetwork.org/forum/discussion/82/an-unknown-source-of-damping-in-tapping-mode-probes Tue, 31 Jan 2012 19:57:08 -0500 vnahid54 82@/forum/discussions
Thanks
Vahid ]]> http://www.nanoprobenetwork.org/forum/discussion/81/test Wed, 21 Dec 2011 16:21:58 -0500 nn admin 81@/forum/discussions http://www.nanoprobenetwork.org/forum/discussion/80/sapphire-surface-roughness-measurements Wed, 21 Dec 2011 16:00:19 -0500 grindstone 80@/forum/discussions http://www.nanoprobenetwork.org/forum/discussion/77/calibration-of-lateral-sensitivity-of-afm-cantilever-mvnm Fri, 25 Mar 2011 22:58:39 -0400 mminary2 77@/forum/discussions http://www.nanoprobenetwork.org/forum/discussion/79/trouble-scanning-tungsten-tips-any-ideas Wed, 10 Aug 2011 13:42:59 -0400 montanez82 79@/forum/discussions I am a undergraduate research assistant and I have been trying to find the surface roughness of Tungsten IFM tips in the AFM. I am a TermoMicroscopes Autoprobe M5 in Tapping Mode. I am placing the Tungsten tip vertically and approaching the apex. I can visually see the tip with the microscope, so I am sure the cantilever is in the correct area. The problem I face is that it seems I get a lot of noise and sometimes the cantilever will "fall off" the tip and I must re-position the cantilever. The radius of curvature of the tip ranges; the smallest radius I have so far (verified by SEM) is 1.63 microns, and the biggest thus far is 20.85 microns. I am able to get readings on tips with radii larger than 14 microns with some time, anything smaller is extremely difficult. Any suggestions?]]> http://www.nanoprobenetwork.org/forum/discussion/78/single-electron-transistor Sun, 26 Jun 2011 14:41:42 -0400 saranya 78@/forum/discussions http://www.nanoprobenetwork.org/forum/discussion/74/best-wedge-method-calibration-grating Mon, 28 Feb 2011 04:38:51 -0500 christian 74@/forum/discussions I am interested in the wedge calibration method.
We are using a UHV-FFM with a scanrange of 3x3mu m.

Varenberg (M. Varenberg, I. Etsion & G. Halperin. "An improved wedge calibration method for lateral force in atomic force microscopy". Rev. Sci. Instrum. 74, 3362-7 (2003)) recommends the TGF11 calibration grid. It is rather big for our small scan-ranges but could in principle be used.

What test grids do you recommend?

Thanks for help in advance,
Christian]]> http://www.nanoprobenetwork.org/forum/discussion/75/cantilever-calibration Wed, 02 Mar 2011 12:57:32 -0500 philip@egberts.com 75@/forum/discussions I am interested in the wedge calibration method.
We are using a UHV-FFM with a scan range of 3x3mu m.

Varenberg (M. Varenberg, I. Etsion & G. Halperin. "An improved wedge calibration method for lateral force in atomic force microscopy". Rev. Sci. Instrum. 74, 3362-7 (2003)) recommends the TGF11 calibration grid. It is rather big for our small scan-ranges but could in principle be used.

What test grids do you recommend?

Thanks for help in advance,
Christian]]> http://www.nanoprobenetwork.org/forum/discussion/19/calculation-of-the-deflection-of-a-cantilever-during-scanning-using-a-contact-mode-afm Wed, 22 Dec 2010 18:22:42 -0500 Huabin 19@/forum/discussions
On the other hand, I am also using an MFP-3D Asylum AFM to do some experiments. I found some discussions regarding the calculation of true deflection (load) of a cantilever during scanning from a forum supported by Asylum Research. Briefly, some guys suggested that the actual deflection value (V) could be calculated by using the data (V) of a defection image to subtract the non-contact value (baseline, V) of a force curve that was collected immediately upon completing the collection of the deflection image. If this is true, it should be convenient for friction measurement.
]]> http://www.nanoprobenetwork.org/forum/discussion/16/lateral-force-calibration-offset-value Sun, 12 Dec 2010 20:19:26 -0500 Huabin 16@/forum/discussions
Thanks a lot for your generosity in posting your codes (for friction measurements) on your group homepage for free academic use. In studying your code-'friction_v_load.m', I have met a bit trouble in understanding the 'offset' value, i.e., how did you determine the 'offset' value? It would be much appreciated if you could give a detailed description for this. Thank you very much for your kind help!

Kind Regards,
Huabin
School of Chemistry
Universtiy of Melbourne
Parkville VIC 3010
Australia]]> http://www.nanoprobenetwork.org/forum/discussion/18/how-to-determine-the-deflection-of-a-cantilever-during-the-scanning-process-using-a-contact-mode-afm Wed, 22 Dec 2010 05:36:43 -0500 Huabin 18@/forum/discussions In my experiment, I use a Nanoscope IV AFM (software Nanoscope 5.31r1). I have several questions regarding the determination of true deflection of the cantilever in a friction measurement, and hope you could give me some help.
(1) Did you mean that the signal of the baseline (out of contact) of a force curve can be taken as the offset value? Could the signal of the photo diode when the cantilever is off surface be used as the offset value?
(2) In your work, by which means did you get the deflection signals of the cantilever in a scanning process?
(3) According to the manual of Multimode AFM (please see pages 196-197 of the manual sent to you by email), the data of an image captured with the Data type set to Deflection could be used to calculate the force exerted on a sample (or deflection of the cantilever) if the feedback gains are set low when collecting the image. It seems a bit difficult here, how to set the gains ideally low?
(4) As you know, in order to calibrate the cantilever, a series of set-point values are usually used in collecting the same image in the friction measurement. In my experiments, I found that the baseline of force curves changes with set-point values. If the offset value mentioned above is obtained by the consideration of the out of contact (baseline) of a force curve (collected immediately upon the completion of imaging), then, at which set-point should a force curve be collected, or how to collect a force curve of which the baseline can be used as the offset value?
(5) Personally, I think that the deflection (load) of the cantilever in the same fast scan line (same set-point) not only depends on set-point, but also depends on the surface features of a sample. Does it make sense?
Thank you very much for your kind help!
Best Regards,
Huabin
]]> http://www.nanoprobenetwork.org/forum/discussion/60/thanks Fri, 22 May 2009 17:03:04 -0400 dawnbonnell 60@/forum/discussions
If you have ideas for future Forums please let us know.

thanks, Dawn]]> http://www.nanoprobenetwork.org/forum/discussion/61/friction-and-pfm Fri, 22 May 2009 12:02:19 -0400 carpick 61@/forum/discussions http://www.nanoprobenetwork.org/forum/discussion/62/physical-interpretation-of-measurements Fri, 22 May 2009 16:27:33 -0400 mbrukman 62@/forum/discussions
Also, which data are more meaningful to report: X or R?

Thanks!]]> http://www.nanoprobenetwork.org/forum/discussion/63/gbs-effects-in-polycrystalline-ferroelectric-thin-films Fri, 22 May 2009 15:43:10 -0400 jingyuanyuan 63@/forum/discussions
2. Usually there are multi-domains inside one grain, is there a way to get a single domain within a grain? Is PFM a good way to do this, or are there some better ways?

Thanks]]> http://www.nanoprobenetwork.org/forum/discussion/64/hysteresis-mapping Fri, 22 May 2009 15:57:46 -0400 snnnnnn 64@/forum/discussions
Thanks.]]> http://www.nanoprobenetwork.org/forum/discussion/65/pfm-image-from-cross-talk Thu, 07 May 2009 18:41:35 -0400 nn admin 65@/forum/discussions http://www.nanoprobenetwork.org/forum/discussion/66/pfm-on-a-microsope Thu, 07 May 2009 18:40:08 -0400 nn admin 66@/forum/discussions http://www.nanoprobenetwork.org/forum/discussion/67/pfm-reference-samples Tue, 19 May 2009 23:12:54 -0400 mark.d.johnson 67@/forum/discussions
I have already investigated periodically poled lithium niobate gratings, but these are $1000 to $2000. Are there less expensive options?]]> http://www.nanoprobenetwork.org/forum/discussion/68/reference-papers Tue, 19 May 2009 12:29:58 -0400 dawnbonnell 68@/forum/discussions http://www.nanoprobenetwork.org/forum/discussion/69/signal-interpretation-in-dfrt-pfm Fri, 22 May 2009 15:19:46 -0400 snnnnnn 69@/forum/discussions
In attempting DFRT PFM of nanoscale ferroelectrics, how is one supposed to interpret the collected signals of multiple amplitude and phase channels (more specifically phase)? Is it correct to assume that the average of Amp1 and Amp2 will yield the magnitude of the response?

As far as phase goes, in published data it has been represented from -100 to 100 in a range representing the domain state orientation, however my collected signal (for both channels) can range from 0-180, 180-270, 270-360, which makes interpretation of these phase signals and the qualitative orientation of the domains unclear. I would greatly appreciate any clarification of these issues.]]> http://www.nanoprobenetwork.org/forum/discussion/70/pfm-in-liquid Thu, 07 May 2009 18:44:18 -0400 nn admin 70@/forum/discussions http://www.nanoprobenetwork.org/forum/discussion/71/relevance-of-d33-in-resonance-enhanced-pfm Sun, 17 May 2009 13:34:16 -0400 steef 71@/forum/discussions http://www.nanoprobenetwork.org/forum/discussion/72/resonance-enhanced-pfm Thu, 07 May 2009 18:43:23 -0400 nn admin 72@/forum/discussions http://www.nanoprobenetwork.org/forum/discussion/73/high-resolution-spectroscopic-data Thu, 07 May 2009 18:42:22 -0400 nn admin 73@/forum/discussions http://www.nanoprobenetwork.org/forum/discussion/45/static-versus-dynamic-calibration Mon, 20 Apr 2009 15:42:11 -0400 tjacobs 45@/forum/discussions